■ 多功(gong)能(neng)(neng)： 該系(xi)統(tong)可(ke)(ke)以(yi)測(ce)(ce)試(shi)(shi)圈(quan)數(shu)(shu)(shu)(shu)(shu)（Turn），圈(quan)數(shu)(shu)(shu)(shu)(shu)比(bi)，電(dian)壓(ya)(ya)(ya) 比(bi)，漏感（LK），電(dian)感（Ls），品質因(yin)數(shu)(shu)(shu)(shu)(shu) （Q），電(dian)容（Cx），阻(zu)抗（Z），交流電(dian)阻(zu) （ACR），直(zhi)流電(dian)阻(zu)（DCR），引(yin)腳短(duan)路（PS）， 平衡(heng)（BL）等(deng)低(di)(di)壓(ya)(ya)(ya)參數(shu)(shu)(shu)(shu)(shu)。也可(ke)(ke)以(yi)進行交流耐壓(ya)(ya)(ya)， 直(zhi)流耐壓(ya)(ya)(ya)，絕緣電(dian)阻(zu)，線圈(quan)脈沖等(deng)高(gao)壓(ya)(ya)(ya)參數(shu)(shu)(shu)(shu)(shu)的(de)測(ce)(ce)試(shi)(shi)■ 高(gao)效(xiao)率： 該系(xi)統(tong)可(ke)(ke)以(yi)自(zi)動(dong)從低(di)(di)壓(ya)(ya)(ya)參數(shu)(shu)(shu)(shu)(shu)測(ce)(ce)試(shi)(shi)切(qie)換(huan)到高(gao)壓(ya)(ya)(ya)參數(shu)(shu)(shu)(shu)(shu)測(ce)(ce)試(shi)(shi)， 所以(yi)參數(shu)(shu)(shu)(shu)(shu)可(ke)(ke)以(yi)一次(ci)性測(ce)(ce)試(shi)(shi)完(wan)成，大大的(de)提高(gao)測(ce)(ce)試(shi)(shi)效(xiao)率■ 數(shu)(shu)(shu)(shu)(shu)據(ju)庫： 該系(xi)統(tong)將(jiang)測(ce)(ce)試(shi)(shi)數(shu)(shu)(shu)(shu)(shu)據(ju)自(zi)動(dong)記錄(lu)到數(shu)(shu)(shu)(shu)(shu)據(ju)庫中，數(shu)(shu)(shu)(shu)(shu)據(ju)的(de)記錄(lu) 更加(jia)快捷可(ke)(ke)靠(kao)，數(shu)(shu)(shu)(shu)(shu)據(ju)的(de)保(bao)存(cun)更方便，數(shu)(shu)(shu)(shu)(shu)據(ju)的(de)安全得到 保(bao)障■ 統(tong)計功(gong)能(neng)(neng)： 該系(xi)統(tong)加(jia)入了各種統(tong)計功(gong)能(neng)(neng)，可(ke)(ke)以(yi)統(tong)計數(shu)(shu)(shu)(shu)(shu)據(ju)的(de)合格率， CPK值，可(ke)(ke)以(yi)繪制控(kong)制圖(tu)，分布圖(tu)等(deng)表圖(tu)■ 高(gao)自(zi)動(dong)化(hua)： 該系(xi)統(tong)能(neng)(neng)夠自(zi)動(dong)切(qie)換(huan)高(gao)低(di)(di)壓(ya)(ya)(ya)參數(shu)(shu)(shu)(shu)(shu)的(de)測(ce)(ce)試(shi)(shi)，測(ce)(ce)試(shi)(shi)數(shu)(shu)(shu)(shu)(shu)據(ju)自(zi)動(dong) 保(bao)存(cun)到數(shu)(shu)(shu)(shu)(shu)據(ju)庫，對測(ce)(ce)試(shi)(shi)數(shu)(shu)(shu)(shu)(shu)據(ju)自(zi)動(dong)進行統(tong)計分析
